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作 者:陈维 杜远超 张玲玲[2,3] 卢鹄 陈保国 刘志杨 李国旗 陈媛[2,3] 舒天娇 杨文杰[2] Chen Wei;Du Yuanchao;Zhang Lingling;Lu Hu;Chen Baoguo;Liu Zhiyang;Li Guoqi;Chen Yuan;Shu Tianjiao;Yang Wenjie(Shanghai Aircraft Manufacturing Co.,Ltd.,Shanghai 201324,China;Shanghai Institute of Laser Technology,Shanghai 200233,China;Shanghai Laser DPM Traceability Engineering Research Center,Shanghai 200233,China)
机构地区:[1]上海飞机制造有限公司,上海201324 [2]上海市激光技术研究所,上海200233 [3]上海激光直接物标溯源工程技术研究中心,上海200233
出 处:《应用激光》2021年第5期1011-1016,共6页Applied Laser
基 金:国家商用飞机制造工程技术研究中心创新基金项目(70560)。
摘 要:采用1 060 nm MOPA激光器对铝合金(2024)进行标识。研究了不同功率下DM码的质量等级和对比度,使用扫描电镜(SEM)观察了标识的表面形貌,使用能谱仪分析了标识表面的成分组成。通过SEM分析,得到在DM码质量等级较高的标识表面,材料被熔化、气化、烧蚀,有大量孔洞和颗粒状物质存在,而在DM码质量等级较低的标识表面,材料仅仅被重铸,表面呈波纹状;通过EDS分析,得到在DM码质量等级较高的标识表面,材料中氧元素含量升高,说明熔化、气化的金属发生氧化反应,而在DM码质量等级较低的标识表面,材料中氧元素增加较少,说明在此条件下金属氧化反应较少。对材料的烧蚀阈值进行计算,为试验提供理论指导。The laser direct marking of Aluminum alloy(2024) was carried out on 1060 nm MOPA laser. The quality grade and contrast of DM codes at different power levels were studied. The surface morphology of the marking was observed by scanning electron microscopy(SEM), and the composition of the marking surface was analyzed by energy dispersive spectrometer(EDS). Through SEM analysis, it was found that the marking surface material with good quality level of DM code is melted, vaporized and ablated, with a large number of holes and granular substances, while the marking surface material with poor quality grade of DM code is only recast and the surface is wavy;EDS analysis shows that the content of oxygen elements in the marking surface materials with higher DM code quality grade increases, indicating that the melted and vaporized metals undergo oxidation reaction, while the amount of oxygen elements on the marking surface with lower DM code quality grade increases less, indicating that the metal oxidation reaction is less under this condition. In this paper, the ablative threshold of the material is calculated to provide theoretical guidance for the test.
关 键 词:激光直接标识 MOPA Al2024 形貌分析 机理
分 类 号:TN249[电子电信—物理电子学]
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