运算放大器运放环模块测试研究  

Research on Operational Amplifier Loop Module Test in Operational Amplifier

作　　者：吴丹[1] 段春阳 李玉玲[1] WU Dan;DUAN Chunyang;LI Yuling(Wuhan Digital Engineering Institute,Wuhan 430205,China)

机构地区：[1]武汉数字工程研究所,武汉430205

出　　处：《电子与封装》2021年第12期13-19,共7页Electronics & Packaging

摘　　要：运算放大器是模拟电路中最重要的单元电路。随着集成电路小型化的发展,运算放大器的测试变得越来越复杂。自动测试系统的运放环模块能够提供高精度的测试资源,并可引出到被测器件接口独立使用,使测试电路的设计更加简单。根据运算放大器参数的物理意义及其测试原理方法,控制运放环模块内部的开关和继电器搭建相应测试电路,可以对运算放大器各参数进行精确、自动测试。实际测试结果表明,该方法能够保证运算放大器的输入失调电压、输出摆幅、开环电压增益、电源电压抑制比及共模抑制比参数测试的准确性。Operational amplifier is the most important unit circuit in the analog circuit.With the development of miniaturization of integrated circuits,the testing of operational amplifiers is becoming more and more complex.The operational amplifier loop of ATE provides high precision test resources,while making all the resources available individually at the interface of device under test,and make the design of the test circuit simpler.According to the physical significance of operational amplifier parameters and its testing principle and method,the corresponding test circuit is built for different parameters by programming the switches and relays of the module,and the parameters of the operational amplifier can be tested accurately and automatically.The actual test results show that this method can ensure the accuracy of the test results when testing the input offset voltage,output swing,open loop voltage gain,power supply voltage rejection ratio and common mode rejection ratio of the operational amplifier.

关 键 词：测试系统 运放环模块 参数测试 

分 类 号：TN722.5[电子电信—电路与系统]