一种物联网终端通用测试设备设计  

Design of a Universal Test Equipment for IoT Terminals

作　　者：邓炳光[1] 禹斯译 闵小芳 周维海 DENG Bingguang;YU Siyi;MIN Xiaofang;ZHOU Weihai(School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications,Chongqing 400065,China)

机构地区：[1]重庆邮电大学通信与信息工程学院,重庆400065

出　　处：《电子器件》2021年第6期1327-1332,共6页Chinese Journal of Electron Devices

基　　金：国家重点研发计划项目(2018YFB2100200)。

摘　　要：针对传统物联网终端测试设备功能单一、可靠性不足等问题,研制了一种通用测试设备。该设备基于ARM+FPGA+STM32架构进行设计,包括主控卡、输入卡、输出卡及电源卡4种CPCI板卡。测试设备通过不同的数据线缆外接多种物联网终端,可对物联网终端进行数字/模拟信号的采集和激励,并集成常见协议接口,能应用于大部分物联网终端测试项目。物联网测试系统的应用,验证了设备在不同终端测试项目下的通用性和可靠性。Aiming at the problems of single function and insufficient reliability of traditional IoT terminal test equipment,a general test equipment has been developed.The equipment is designed based on the ARM+FPGA+STM32 architecture,including four CPCI boards:main control card,input card,output card and power card.The test equipment is connected to a variety of IoT terminals through different data cables,which can collect and stimulate digital/analog signals of the IoT terminals,and integrate common protocol interfaces,which can be applied to most IoT terminal test projects.The application of an Internet of Things test system verifies the universality and reliability of the equipment under different terminal test items.

关 键 词：物联网终端 通用测试设备 ARM FPGA STM32 协议接口 

分 类 号：TH89[机械工程—仪器科学与技术]