基于J750Ex-HD的32位MCU芯片在线测试技术  

On-Line Testing Techniques of 32 bit MCU Chip Based on J750Ex-HD

作　　者：余永涛[1] 王小强[1] 余俊杰 陈煜海 罗军 YU Yongtao;WANG Xiaoqiang;YU Junjie;CHNE Yuhai;LUO Jun(The Fifth Electronics Research Institute of Ministry of Industry and Information Technology,Guangzhou 511300,China)

机构地区：[1]工业和信息化部电子第五研究所,广州511300

出　　处：《电子与封装》2022年第3期35-40,共6页Electronics & Packaging

基　　金：广东省重点领域研发计划(2018B010142001)。

摘　　要：微控制器(Microcontroller Unit,MCU)芯片以其高性能、多功能、可编程、低功耗等优点被广泛应用于各种信号处理和嵌入式系统。MCU芯片在线测试是保证产品质量的重要技术手段,如何实现高性能和复杂功能的高效测试是MCU芯片在线测试的难点。针对一款32位高性能MCU芯片,基于J750Ex-HD型集成电路ATE测试系统开展了MCU芯片在线测试技术研究,详细说明了MCU芯片内部的POR/PDR、GPIO、ADC、Trimming、存储器等功能模块的功能性验证方法。按照MCU在线测试方法流程,设计制作了MCU芯片测试适配器,开发了基于VBT编程的芯片测试程序,实现了批量MCU芯片的在线测试。With the advantage characteristics of high performances,complex function,programmable and low power,microcontroller unit(MCU)chips are widely used in signal processing and embedded systems.On-line mass production testing is the most important quality assurance technique,how to achieve high performance and efficient testing of complex functions is the difficulty of online testing of MCU chips.The on-line testing techniques of 32 bit MCU chip are developed based on J750Ex-HD IC ATE testing equipment.The functional test methods of MCU modules,such as POR/PDR,GPIO,ADC,trimming and memory are presented.According to the testing flow of MCU,the ATE testing loadboard and socket are designed,the on-line testing programs are developed based on VBT,which realize the on-line testing of batch MCU chips.

关 键 词：微控制单元 ATE测试系统 功能测试 修调测试 ADC测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]