FPGA内部资源测试探讨  

Discussion on Internal Resource Testing of FPGA

作　　者：贺云 肖梦燕 唐锐[2] HE Yun;XIAO Mengyan;TANG Rui(CEPREI,Guangzhou 511370,China)

机构地区：[1]工业和信息化部电子第五研究所电子元器件应用验证中心,广东广州511370 [2]工业和信息化部电子第五研究所元器件检测中心,广东广州511370

出　　处：《电子产品可靠性与环境试验》2022年第1期36-41,共6页Electronic Product Reliability and Environmental Testing

摘　　要：FPGA功能的稳定与可靠对于其应用至关重要。根据FPGA内部结构特点将其分为可配置逻辑模块、输入输出单元、内部互连线路、块RAM、 DSP和时钟管理单元,以及其他特殊的功能模块,阐述了主要的FPGA测试方法并进行简要的比较。通过分析FPGA的典型故障,比如固定型故障、短路故障、开路故障、暂态故障和延迟故障等,归纳了各个模块对应的测试方法,以期能够帮助简化FPGA测试工作,提高FPGA测试效率。The stability and reliability of FPGA functions are critical to its application.According to the internal structure of FPGA,it is divided into configurable logic module,input and output unit,internal interconnection circuit,block RAM,DSP,clock management unit and other special function modules,and the main FPGA testing methods are explained and compared briefly.Through the analysis of typical FPGA faults,such as fixed faults,short-circuit fauts,open-circuit faults,transient faults and delayed faults,the test methods corresponding to each module are summarized so as to help simplify FPGA test work and improve FPGA test.

关 键 词：可编程逻辑阵列 内部结构 故障类型 测试方法 

分 类 号：TP302.2[自动化与计算机技术—计算机系统结构]