雪崩光电二极管过剩噪声的测量和抑制方法  

Measurement and Suppression Method for Excess Noise in Avalanche Photodiodes

作　　者：李再波 李云雪 马旭 田亚芳[3] 史衍丽 LI Zaibo;LI Yunxue;MA Xu;TIAN Yafang;SHI Yanli(School of Physics and Astronomy,Yunnan University,Kunming 650091,China;Key Laboratory of Quantum Information,Yunnan University,Kunming 650091,China;Faculty of Science,Kunming University of Science and Technology,Kunming 650093,China)

机构地区：[1]云南大学物理与天文学院,云南昆明650091 [2]云南大学量子信息重点实验室,云南昆明650091 [3]昆明理工大学理学院,云南昆明650093

出　　处：《红外技术》2022年第4期343-350,共8页Infrared Technology

基　　金：云南大学研究生科研创新基金项目(2020290);云南省重大科技项目(2018ZI002)。

摘　　要：雪崩光电二极管(APD)因为其高灵敏度和高增益带宽的优势已被广泛应用在高比特率、远程光纤通信系统中,而雪崩过程中产生的过剩噪声直接影响到APD的信噪比,因此,研究过剩噪声对APD性能的提升具有重要意义。目前,国内外测试雪崩光电二极管过剩噪声的方法主要有直接功率测量法和相敏探测法,本文对这两种测试方法和其优缺点进行了分析,并介绍了最新的改进测试思路。同时,还总结了降低过剩噪声的3种方法:选择低碰撞电离系数比的材料,降低倍增层厚度和采用APD碰撞电离工程来降低噪声。Avalanche photodiodes(APDs)have been widely used in high bit rate,long-distance optical fiber communication systems because of their high sensitivity and gain bandwidth.The excess noise generated in the avalanche process has a significant impact on the sensitivity of APD.Therefore,the study of excess noise is crucial for the improvement of APD performance.The existing methods for testing excess noise of avalanche photodiodes primarily include direct power measurement and phase-sensitive detection.This article briefly introduces these testing methods,analyzes their advantages and disadvantages,and summarizes the state-ofthe-art testing methods.Additionally,three methods to reduce excess noise are summarized:choosing materials with low impact ionization coefficient,using relaxation space to change the thickness of the multiplier layer to reduce the number of impact ionization of carriers and engineering the APD for appropriately heterogeneous impact ionization.

关 键 词：雪崩光电二极管 过剩噪声因子 相敏探测法 碰撞电离工程 

分 类 号：TN215[电子电信—物理电子学]