辅助优化FPGA综合效果的测试例自动生成方法  

Method of Automatically Generating Test Cases for Evaluating the Comprehensive Effect of FPGA Synthesis

作　　者：刘佩 惠锋 LIU Pei;HUI Feng(East Technology,Inc.,Wuxi 214072,China)

机构地区：[1]无锡中微亿芯有限公司,江苏无锡214072

出　　处：《电子与封装》2022年第4期37-43,共7页Electronics & Packaging

摘　　要：FPGA支持软件的质量极大地影响电子工程设计师的工作效率,而FPGA综合是FPGA设计流程的关键步骤,是后续所有工作的基础,极大地影响FPGA设计工具的效果。测试例自动生成技术的研究可以有效驱动FPGA设计工具的开发和质量提升。提出一种测试例自动生成方法,通过注入可控的“无关项”或“冗余项”,以及可调的输入、输出和逻辑层次等参数,使得生成的测试例可以被用于测试FPGA综合中的逻辑优化策略是否达到预期,辅助优化FPGA综合效果。The quality of FPGA supporting software greatly affects the work efficiency of electronic engineering designers.FPGA synthesis is an important part of FPGA design process and the basis for all subsequent work,which greatly affects the effect of FPGA tools.The research of automatic test case generation technology can effectively drive the development of FPGA design tools and the quality improvement.A method for automatically generating test cases is introduced.This method uses controllable injection of"Don’t Cares"or"Redundancy",as well as adjustable input and output parameters and logic levels to generate test cases.The generated test cases can be used to test whether various strategies for logic optimization in FPGA synthesis achieve the expected goals,and assist in optimizing the FPGA synthesis effect.

关 键 词：FPGA 逻辑优化 自动测试 测试例生成 

分 类 号：TN402[电子电信—微电子学与固体电子学]