基于非下采样剪切波变换的元素分布与形貌信息融合方法在触头表面微观分析上的应用  

Application of Element Distribution and Topography Information Fusion Method Based on NSST in Contact Surface Microscopic Analysis

作　　者：李文华[1] 赵培董 赵正元[2] 潘如政[1] 胡康生 Li Wenhua;Zhao Peidong;Zhao Zhengyuan;Pan Ruzheng;Hu Kangsheng(State Key Laboratory of Reliability and Intelligence of Electrical Equipment Jointly Constructed by Hebei University of Technology,Tianjin 300130 China;Shenyang Railway Signal Co.Ltd,Shenyang 110000 China)

机构地区：[1]省部共建电工装备可靠性与智能化国家重点实验室(河北工业大学),天津300130 [2]沈阳铁路信号有限责任公司,沈阳110000

出　　处：《电工技术学报》2022年第13期3331-3340,共10页Transactions of China Electrotechnical Society

基　　金：河北省自然科学基金(E2020202221);河北省自然科学基金创新群体项目(E2020202142)资助。

摘　　要：针对观察单模态图像难以对触头表面进行完整评价的问题,为将所有相关信息从多种模式有效部署到单个图像中,该文提出一种基于非下采样剪切波变换(NSST)的元素分布与形貌信息融合方法。对于扫描电子显微镜&X-射线能谱仪(SEM&EDS)记录的触头表面的元素分布与三维非接触式分析系统记录的表面微观形貌信息,首先在鲸鱼优化算法(WOA)的帮助下,采用基于B样条配准方法;其次应用一种新的加权能量融合规则,实现了具有不同分辨率的多模图像的融合;最后从融合触头图像中圈定出不同元素分布。通过融合结果,该文分析了触头材料转移和微观形貌,研究了触头表面元素分布,为分析触头表面结构变化、分析并定位表面聚集膜以及准确地计算接触电阻奠定了基础。Aiming at the problem that it is difficult to evaluate the contact surface completely when observing a single-modal image, in order to effectively deploy all relevant information from multiple modalities into a single-modal image, the paper proposes a non-subsampled shearlet transform(NSST)fusion method of element distribution and topography information. For the analysis of the element distribution on the contact surface recorded by scanning electron microscope & X-ray energy dispersive spectrometer(SEM&EDS) and the surface microtopography information recorded by 3D non-contact analysis system. First, with the help of whale optimization algorithm(WOA), the registration method based on B-spline is adopted. Next, a new weighted energy fusion rule is applied to achieve the fusion of multi-mode images with different resolutions. Finally, different element distributions are delineated from the fused contact images. Through the fusion results, the material transfer and microstructure of the contact were analyzed, and the element distribution on the contact surface was studied. It lays a foundation for analyzing the structure change of contact surface, analyzing and locating the surface fouling film and calculating the contact resistance accurately.

关 键 词：继电器触头 图像融合 非下采样剪切波变换 扫描电子显微镜和X-射线能谱仪 表面形貌 

分 类 号：TM581[电气工程—电器]