高速模数转换器的关键测量技术  

A Key Measurement Technique of High Speed ADC

作　　者：张琳 岂飞涛[1,2] 刘涛 朱蓓丽[1,2] 刘海南[1,2] 滕瑞 李博[1,2] 赵发展 罗家俊[1,2] 韩郑生[1,2,3] ZHANG Lin;QI Feitao;LIU Tao;ZHU Beili;LIU Hainan;TENG Rui;LI Bo;ZHAO Fazhan;LUO Jiajun;HAN Zhengsheng(Institute of Microelec.,Chinese Academy of Sci.,Beijing 100029,P.R.China;Key Lab.of Sci.and Technol.on Silicon Dev.,Chinese Academy of Sci.,Beijing 100029,P.R.China;Univ.of Chinese Academy of Sci.,Beijing 100049,P.R.China)

机构地区：[1]中国科学院微电子研究所,北京100029 [2]中国科学院硅器件技术重点实验室,北京100029 [3]中国科学院大学,北京100049

出　　处：《微电子学》2022年第2期334-338,共5页Microelectronics

摘　　要：对高速ADC的测量技术进行了分析研究,提出了基于高速ADC AD9433的测量方案。系统阐述了两类模拟输入驱动电路原理,详细介绍了两种模拟驱动电路和时钟电路抖动的分析方法。将上述理论分析应用于AD9433测量方案,测量结果证明了上述理论分析的正确性。The measurement techniques of high speed ADC were studied. A measurement scheme based on high speed ADC AD9433 was proposed. The principles of two kinds of analog input driving circuits were described systematically. Two analysis methods of analog driving circuit and clock circuit jitter were introduced in detail, The above theoretical analysis was applied to AD9433 measurement scheme. The measurement results proved the correctness of the above theoretical analysis.

关 键 词：高速ADC 测量 模拟驱动电路 时钟抖动 

分 类 号：TN407[电子电信—微电子学与固体电子学] TN792