基于蚁群算法的测试向量生成研究  

Research of test vector generation based on ant colony algorithm

作　　者：康鹏 金婕[1] 严伟[2] KANG Peng;JIN Jie;YAN Wei(School of Electronic and Electrical Engineering,Shanghai University of Engineering Science,Shanghai 201620,China;School of Software and Microelectronics,Peking University,Beijing 102600,China)

机构地区：[1]上海工程技术大学电子电气工程学院,上海201620 [2]北京大学软件与微电子学院,北京102600

出　　处：《智能计算机与应用》2022年第9期128-132,共5页Intelligent Computer and Applications

摘　　要：针对边界扫描算法中,采用无限制短路故障模型生成测试矩阵时,存在测试时间长、诊断精度低的问题,在对结构测试算法进行研究的基础上,提出一种基于蚁群算法的测试向量生成方法。通过电路板结构信息建立有限制故障模型,引入图论方法,利用蚁群算法生成最优化的测试向量集。经过实际电路板实验,在保证测试完备性的前提下,该方法生成的测试向量集具有较好的紧凑性,有效地提高测试效率,降低测试成本。Aiming at the problems of long test time and low diagnostic accuracy when using the unrestricted short-circuit fault model to generate the test matrix in the boundary scan algorithm, a test vector generation method based on the ant colony algorithm is proposed on the basis of the research on the structure test algorithm.The limited fault model is established based on the circuit board structure information, the graph theory method is introduced, and the ant colony algorithm is used to generate the optimal test vector set.After the actual circuit board experiment, under the premise of ensuring the completeness of the test, the test vector set generated by this method has better compactness, which effectively improves the test efficiency and reduces the test cost.

关 键 词：测试向量 有限制故障模型 蚁群算法 

分 类 号：TN407[电子电信—微电子学与固体电子学]