低能离子与物质相互作用中电子能损微观机制的研究进展  

Progress on microscopic mechanism of electronic energy loss in the interactions between low energy ions and matter

作　　者：张丰收[1,2,7] 付艳龙 毛飞 李长楷[5] 张超 ZHANG Fengshou;FU Yanlong;MAO Fei;LI Changkai;ZHANG Chao(The Key Laboratory of Beam Technology of Ministry of Education.College of Nuclear Science and Technology,Beijing Normal University,100875,Beijing,China;Institute of Radiation Technology,Beijing Academy of Science and Technology,100875,Beijing,China;Department of Astronomy,Bejing Normal University,100875,Beijing,China;School of Nuclear Science and Technology,University of South China,421001,Hengyang,Hunan,China;School of Physics,Peking University,100871,Beijing,China;School of Materials Science and Engineering,Anhui University of Science and Technology,232001,Huainan,Anhui,China;Center of Theoretical Nuclear Physics,National Laboratory of Heavy Ion Accelerator of Lanzhou,530004,Lanzhou,Gansu,China)

机构地区：[1]射线束技术教育部重点实验室,北京师范大学核科学与技术学院,北京100875 [2]辐射技术研究所,北京市科学技术研究院,北京100875 [3]北京师范大学天文系,北京100875 [4]南华大学核科学技术学院,湖南衡阳421001 [5]北京大学物理学院,北京100871 [6]安徽理工大学材料科学与工程学院,安徽淮南232001 [7]兰州重离子加速器国家实验室原子核理论研究中心,甘肃兰州530004

出　　处：《北京师范大学学报（自然科学版）》2022年第5期755-762,共8页Journal of Beijing Normal University(Natural Science)

基　　金：国家自然科学基金资助项目(12147159,12135004,11635003,11961141004,12105091,12047513,11975119)。

摘　　要：深入了解离子与物质的相互作用是研究材料抗辐照性能以及应用离子束技术的基础和关键.离子的能量沉积是导致材料辐照损伤的根本原因,所以研究离子碰撞过程中的能损机制显得尤为重要.本文从离子与物质相互作用机制的研究背景和应用价值出发,阐述了有关载能离子在材料中的电子阻止本领的微观机制,总结了基于第一性原理分子动力学研究低速离子在材料中电子阻止本领的相关模型.回顾了国内外关于低能离子与物质相互作用中电子阻止本领及电子能损微观机制的理论和实验研究进展及发展趋势,论述了近几年北京师范大学在有关电子能损微观机制方面所取得的研究成果.阐述了电荷转移、化学键状态以及内层电子激发等因素对电子能损影响的微观机制,研究了在极低速度下电子阻止本领的阈值行为,为离子束技术的应用和材料抗辐照性能的评估提供了理论依据.对未来的研究进行建议展望.A thorough knowledge of the ion-matter interaction is the basis and key to studying the anti-radiation performance of materials and solving the specific application of ion beam technology. The energy deposition of ions is the fundamental cause of irradiation damage to materials, so it is particularly important to study the energy loss mechanism in the process of ion collision. This paper will introduce the background and application value of energetic ions in the material and summarize the model of slow ions in the material based on first principles. In addition,the research progress and development trend of electronic stopping power and microscopic mechanism of electronic energy loss in the interaction between low energy ions and matter at home and abroad are reviewed from theoretical and experimental aspects,and the research results of Beijing Normal University on electronic energy loss in recent years are reviewed. The microscopic mechanism of electronic energy loss affected by charge transfer,chemical bond state,inner electron excitation,and other factors is expounded. The threshold behavior of electron stopping ability at a very low speed is studied, which provides a theoretical basis for the application of ion beam technology and the evaluation of the anti-irradiation performance of materials. Finally,the preliminary work is summarized and the future research is reviewed.

关 键 词：离子与物质相互作用 电子能损 电子阻止本领 低能离子 

分 类 号：O562.5[理学—原子与分子物理]