太赫兹光致力近场显微成像技术及应用研究  

Terahertz photoinduced force near-field microscopy and application

作　　者：冯邱锴 刘逍 游冠军 FENG Qiukai;LIU Xiao;YOU Guanjun(School of Optical-Electrical and Computer Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China)

机构地区：[1]上海理工大学光电信息与计算机工程学院,上海200093

出　　处：《光学仪器》2022年第5期61-68,共8页Optical Instruments

基　　金：国家重点研发计划(2017YFF0106304、2016YFF0200306)。

摘　　要：设计并搭建了太赫兹光致力显微成像系统(THz PiFM),首次在太赫兹波段实现了近场光力纳米显微成像测量。该系统基于原子力显微镜,利用探针对所受力的灵敏检测能力,通过探测探针与样品之间近场偶极相互作用产生的光场梯度力,实现无探测器的太赫兹近场显微成像。利用该系统,对可见光激发下的单层MoS_(2)晶粒进行了近场纳米显微成像表征,并分析了晶粒边缘近场光力信号增强的机制。研究结果表明,THz PiFM对二维材料中的载流子具有高灵敏的探测能力。与传统的太赫兹近场显微成像技术相比,THz PiFM无需太赫兹探测器,而且可获得更加优越的空间分辨率和成像信噪比,是一种低成本、高性能的新型太赫兹近场显微成像技术。In this paper,terahertz photoinduced force microscopy(THz PiFM)is designed and built,which realizes the near-field photoinduced force nanoscopic imaging measurement in the terahertz band for the first time.Based on the atomic force microscopy,the system uses the sensitive detection ability of the probe to the force,and realizes the terahertz near-field microscopic imaging without detector.The system detected the light field gradient force generated by the near-field dipole interaction between the probe and the sample.The near-field nanoscopic imaging characterization of monolayer MoS_(2)grains excited by visible light was carried out,and the mechanism of near-field optical signal enhancement at the grain edge was analyzed.The results show that THz PiFM has a highly sensitive detection capability for carriers in two-dimensional materials.Compared with the traditional terahertz near-field microscopy imaging technology,THz PiFM does not require terahertz detector,and is a new low-cost,high-performance terahertz near-field microscopy imaging technology,and can achieve superior spatial resolution and imaging signal-to-noise ratio.

关 键 词：光致力显微镜 MoS_(2) 太赫兹近场成像 载流子分布 

分 类 号：O433[机械工程—光学工程]