可扩展式微处理器总剂量效应在线测试系统研制  

Development of extendable on-line test system for total ionizing dose effect of microprocessor

作　　者：陈法国[1,2] 于伟跃 梁润成 郑智睿 郭荣 CHEN Faguo;YU Weiyue;LIANG Runcheng;ZHENG Zhirui;GUO Rong(China Institute for Radiation Protection,Taiyuan 030006,China;Shanxi Provincial Key Laboratory for Translational Nuclear Medicine and Precision Protection,Taiyuan 030006,China)

机构地区：[1]中国辐射防护研究院,太原030006 [2]核药研发转化及精准防护山西省重点实验室,太原030006

出　　处：《核技术》2022年第11期60-67,共8页Nuclear Techniques

基　　金：中核集团青年英才计划项目(No.CNNC20010701);抗辐照应用技术创新中心项目(No.KFZC2020020302)资助。

摘　　要：针对功能丰富、大规模集成微处理器总剂量效应的测试需要,研制了一种可扩展式的在线测试系统。测试系统由主控制电路、可扩展信号采集电路、被测样品接口、上位机及配套软件组成,提供了功耗电流、片内存储、通信、时钟、模数/数模转换、直接存储访问等多种参数测量或功能校验方法。利用测试系统对16个特征尺寸40 nm的微处理器开展了^(60)Co源辐照实验,所有样品在吸收剂量达到(377.44±20.34)Gy(Si)后出现了数字通信中断、功耗电流突然下降、模数/数模输出异常等现象。综合所有12项测量或校验结果,推断该微处理器的总剂量失效模式很可能是部分内核指令无法执行而导致的功能失效,同时也说明在线原位测试系统能够为总剂量失效模式分析提供更多、更直接的数据信息。[Background]Compared with transistors and small-scale integrated circuits,the total ionizing dose(TID)effect and testing of multifunctional large scale integrated microprocessors are more complex.The difficulty of testing is to analyze the failure mode of microprocessor online from limited information under irradiation.[Purpose]This study aims to develop an extendable on-line test system for TID effect of microprocessor and carry out preliminary application.[Methods]The testing system was composed of control circuit,extendable signal acquisition circuit,tested sample interface,upper computer and software.Multiple parametric measurement or functional verification methods such as power consumption current,on-chip memory,communication,clock,analog-to-digital/digital-to-analog converter(ADC/DAC)and direct memory access of microprocessor were provided.Sixteen microprocessors with feature size 40 nm were irradiated with ^(60)Co source and tested on-line.[Results]After the irradiation dose is accumulated to(377.44±20.34)Gy(Si),all samples are malfunctional with digital communication interruption,sudden drop in current consumption,abnormal ADC/DAC output and so on.[Conclusion]Based on all 12 kinds of parametric measurement or functional verification results,the TID effect of this type of microprocessor is probable to be a functional failure caused by some kernel instructions.The on-line test system of this study can provide more direct data information for the total dose failure mode analysis.

关 键 词：总剂量效应 在线测试 微处理器 参数退化 功能失效 

分 类 号：TL99[核科学技术—核技术及应用]