基于片上系统的电子设备可靠性预计方法研究  

Prediction Method Study of Reliability of Electronic Equipment Based on System-on-Chip

作　　者：李欣荣 杨云 雷庭 余昭杰[1,2] 郑丽香 LI Xinrong;YANG Yun;LEI Ting;YU Zhaojie;ZHENG Lixiang(China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou 511370,China;Key Laboratory of Industrial Equipment Quality Big Data,MIIT,Guangzhou 511370,China)

机构地区：[1]工业和信息化部电子第五研究所,广东广州511370 [2]工业装备质量大数据重点实验室,广东广州511370

出　　处：《工业技术创新》2022年第5期116-122,共7页Industrial Technology Innovation

摘　　要：随着片上系统(SoC)设计规模的增大和集成度的提高,SoC及其配套设备的可靠性问题被提上议程。以某应用于航空环境的SoC电子设备为研究对象,分别采用基于GJB/Z 299C的可靠性预计方法(预计手册方法)和基于失效物理的可靠性预计方法(失效物理方法),推演其在典型航空环境下的失效寿命等参数。采用两种方法计算得到的电子设备失效寿命分别为10.08年和12.6年。深入对比分析得知:预计手册方法工程实操性强、操作简单,只要得到所需的支撑数据,即可根据各类别元器件的预计模型分析得到电子设备的可靠性水平;失效物理方法实施流程繁琐,需要构建产品结构模型,考虑应力剖面、使用材料等因素,但在明确产品的主要失效模式与失效机理中具有一定优势。With the design scale increase and integration improvement of system-on-chip (SoC),the reliability of SoC and its supporting equipment has been put on the agenda.Taking an SoC electronic equipment applied in the aviation environment as the research object,the reliability prediction method based on GJB/Z 299C (prediction manual method) and the reliability prediction method based on failure physics (failure physics method) were respectively used to deduce its parameters such as the failure life in the typical aviation environment.The failure life of the electronic equipment calculated by the two methods is 10.08 years and 12.6 years respectively.Through in-depth comparison and analysis,it is known that the prediction manual method is highly practical and easy to operate.As long as the required supporting data is obtained,the reliability level of electronic equipment can be obtained according to the prediction model analysis of various components.The implementation process of the failure physics method is tedious,and it is necessary to build a product structure model and consider the factors such as stress profile and materials used.However,it has certain advantages in defining the main failure modes and mechanisms of products.

关 键 词：片上系统 失效物理 失效寿命 应力剖面 失效机理 

分 类 号：V243[航空宇航科学与技术—飞行器设计]