X射线衍射仪校准方法的设计  

Design of calibration method for X-ray diffractometer

作　　者：陈晓东[1] 张玉敏[1] Chen Xiaodong;Zhang Yumin(College of Chemistry Jilin University,ChangChun 130012,China)

机构地区：[1]吉林大学化学学院,长春130012

出　　处：《分析仪器》2022年第6期35-39,共5页Analytical Instrumentation

基　　金：2021年吉林大学实验技术项目(SYXM2021b001)。

摘　　要：X射线衍射仪的校准是保证仪器准确测量的重要工作,但是仪器厂家并没有提供给用户详细校准方法。根据对仪器光学系统和工作原理的分析,设计了使用荧光板对X射线衍射仪进行校准的方法,并依据JJG 629-2014《多晶X射线衍射仪检定规程》对校准后的仪器进行了2θ角示值误差,2θ角分辨力和2θ角重复性检定。结果表明,该方法适合X射线衍射仪的校准工作。According to the analysis of the optical system and working principle of the instrument,the method of calibrating the X-ray diffractometer with a fluorescent plate is designed.According to the verification regulation of polycrystalline X-ray diffractometer(JJG 629-2014),the calibrated instrument is calibrated for 2θangular indication error,2θangular resolution and 2θangular repeatability.The results show that this method is suitable for the calibration of X-ray diffractometer.

关 键 词：X射线衍射仪(XRD) XRD校准方法 测角仪校准 

分 类 号：O72[理学—晶体学] TH74[机械工程—光学工程]