晶面表征中密勒指数的几何含义  

Geometric Meanings of Miller Index for Characterization of Crystalline Plane

作　　者：熊信柏[1] 万学娟 马俊[1] 黎晓华[1] XIONG Xin-bo;WANG Xue-juan;MA Jun;LI Xiao-hua(Shenzhen Key Laboratory of Special Functional Materials,Shenzhen Engineering Laborary for Advanced Technology of Ceramics,College of Materials Science,Shenzhen University,Guangdong Shenzhen 518060,China)

机构地区：[1]深圳大学材料学院,广东省功能材料界面工程技术研究中心,深圳特种功能材料重点实验室,深圳陶瓷先进技术工程中心,广东深圳518060

出　　处：《广州化工》2022年第23期196-197,共2页GuangZhou Chemical Industry

基　　金：广东省高等教育教学改革项目(GDJC20142288);深圳大学教学改革项目(GDJC20142288)。

摘　　要：密勒指数,即晶面指数,是晶体学中的重要参数之一。现有教材仅给出了晶面指数的确定过程,未给出其背后的几何含义。本文从空间解析几何和向量代数分析入手,结合晶体点阵性质,给出了密勒指数能够表征晶面特征的原因,以方面学生理解和掌握这方面的教学内容。Miller index, i.e. crystalline plane index, is one of the important parameters in crystallography. Current textbooks only provide the definition of crystalline plane index, but do not give its geometric meanings. With the analyses of spatial analytic geometry and vector algebra, togather with the properties of crystal lattice, the reasons for Miller index can be used to characterize the characteristics of crystal surface were explained, which could help students understand and master this teaching content of Miller index.

关 键 词：晶面指数 晶面 表征 几何含义 教学方法 

分 类 号：O721[理学—晶体学] TB303[一般工业技术—材料科学与工程]