红外微扫描超分辨率仿真分析与实验研究  

Simulation Analysis and Experimental Study of Infrared Micro-scanning Super-resolution

作　　者：于快快 郝克 刘严严[1] 刘政 杜玉萍[1] 梁志强[2] 常瑶 李宇海 YU Kuaikuai;HAO Ke;LIU Yanyan;LIU Zheng;DU Yuping;LIANG Zhiqiang(Science and Technology on Electro-Optical Information Security Control Laboratory,Tianjin,China;Academy of Opto-Electronics,China Electronics Technology Group Corporation(AOE CETC),Tianjin,China)

机构地区：[1]光电信息控制和安全技术重点实验室,天津 [2]中国电子科技集团公司光电研究院,天津 [3]不详

出　　处：《光电技术应用》2023年第1期46-51,共6页Electro-Optic Technology Application

摘　　要：对微扫描成像技术的研究现状进行了分析,建立了红外成像系统模型,分析了微扫描成像技术的技术原理,对其超分辨能力理论仿真分析,并通过实际红外微扫描成像系统对超分辨率效果进行验证,并对成像结果进行了分析和评价。The research status of micro-scanning imaging technology is analyzed, and the infrared imaging system model is established. The technical principle of micro-scanning imaging technology is analyzed, the theoretical simulation of its super resolution capability is analyzed, and the effect of the super-resolution is verified by the actual infrared micro-scanning imaging system, and the imaging results are analyzed and evaluated.

关 键 词：微扫描 超分辨率 信息熵 质量评价 

分 类 号：TN216[电子电信—物理电子学]