高压直流VBE系统光发射板故障研究  

Research on Light-Emitting Board Failure of HVDC VBE System

作　　者：苏杰和[1] 张朝辉[1] 梁梓贤 SU Jie-he;ZHANG Zhao-hui;LIANG Zi-xian(Guangzhou Bureau of China Southern Power Grids EHV Transmission Company,Guangzhou 510663,China)

机构地区：[1]中国南方电网有限责任公司超高压输电公司广州局,广东广州510663

出　　处：《电工电气》2023年第4期43-46,70,共5页Electrotechnics Electric

摘　　要：针对阀基电子设备(VBE)系统光发射板频繁故障问题,通过破解光发射板的电路,分别对光耦输入电路、逻辑控制电路、发光二极管一级与二级驱动电路进行逐一分析及测试,定位出导致光发射板故障的易损元件;通过建立热流等效电路仿真模型研究环境温度对故障元件的影响,进而明确导致元件故障的原因。对VBE屏柜以及易损元件发光二极管和场效应管提出改进措施,以避免元件长期在高温环境下运行导致老化加速甚至故障。Faults frequently occur to the light-emitting board of Valve-Based Electronic(VBE)system,so the paper,through cracking the circuit of the light-emitting board,analyzes and tests the optical coupler input circuit,logical control,first and second level drive circuits of laser tubes,and then locates vulnerable components that contribute to light-emitting board faults.It also builds a heat flow equivalent circuit simulation model to study the effects of ambient temperature on faulty elements to further find out reasons for component failures.Moreover,the paper puts forward improvement measures of VBE screen cabinets,light emitting diodes and field effect transistors of vulnerable components to avoid aging acceleration and failures caused by long-term operation of components under high temperature environment.

关 键 词：阀基电子设备 光发射板 场效应管 

分 类 号：TM721.1[电气工程—电力系统及自动化]