一种基于STM32的ADC数据采集系统设计  

Design of ADC data acquisition system based on STM32

作　　者：张泽 姚育成[1] 鲍迪 李珉澄 邓晓月 ZHANG Ze;YAO Yucheng;BAO Di;LI Mincheng;DENG Xiaoyue(Hubei University of Technology,Wuhan 430068,China;Geo Micro Devices(Xiamen)Co.,Ltd.,Shanghai 201203,China)

机构地区：[1]湖北工业大学,湖北武汉430068 [2]格威半导体(厦门)有限公司,上海201203

出　　处：《现代电子技术》2023年第10期47-53,共7页Modern Electronics Technique

基　　金：湖北省高等学校优秀中青年科技创新团队计划项目(T201907)。

摘　　要：电池管理系统芯片是当前的主流芯片之一,其中ADC模块发挥着重要的作用。ADC静态参数中的INL和DNL是测评ADC性能的重要指标,但使用专业设备测试INL和DNL成本过高,因此开发价格低廉的测试板替代专业设备的需求日益显著。为此,文中设计一种价格低廉的ADC静态参数测试系统。首先,阐述测试系统的基本实现原理;然后,从硬件系统和软件系统两个方面进行具体设计。实验测试结果表明,所设计系统可靠性高且成本低廉,可用于电源管理芯片ADC模块的INL和DNL参数测试。The battery management system chip is one of the current mainstream chips,in which the ADC module plays an important role.The INL and DNL in the static parameters of ADC are important indicators to evaluate the performance of ADC.However,the cost of using professional equipments to test INL and DNL is too high,so the demand for developing low⁃cost test boards to replace professional equipment is increasingly significant.Therefore,a cheap ADC static parameter testing system is designed.The basic realization principle of the testing system is elaborated,and then the specific design is carried out in two aspects of hardware system and software system.The experimental results show that the designed system has high reliability and low cost,and can be used to test the INL and DNL parameters of ADC module in the power management chip.

关 键 词：数据采集系统 SAR⁃ADC STM32处理器 测试系统 信号发射器 CAN通信 

分 类 号：TN711-34[电子电信—电路与系统] TP311[自动化与计算机技术—计算机软件与理论]