结温导向的两电平逆变器寿命优化控制  

Life Optimization Control of Junction Temperature-oriented Two-level Inverters

作　　者：万宇宾 刘红文 杜京润 李佳怡 周瑞睿 WAN Yubin;LIU Hongwen;DU Jingrun;LI Jiayi;ZHOU Ruirui(CRRC Zhuzhou Electric Locomotive Research Institute,Zhuzhou 412000,China;School of Traffic and Transportation,Central South University,Changsha 410075,China)

机构地区：[1]中车株洲电力机车研究所,湖南株洲412000 [2]中南大学交通运输工程学院,湖南长沙410075

出　　处：《电工技术》2023年第8期147-151,164,共6页Electric Engineering

基　　金：国家重点研发计划(编号2022YFB4201602-02)。

摘　　要：结温是影响IGBT(Insulated-Gate Bipolar Transistor)寿命的关键因素,为了延长两电平逆变器寿命,提出一种改进的模型预测电流控制(Model Predictive Current Control,MPCC)策略。首先,针对功率损耗产生原理,建立IGBT的损耗因子;其次,考虑三相电流方向和不同功率管的导通情况,在IGBT开关和导通时刻加入不同的损耗因子,控制功率损耗的产生。通过仿真验证,相比传统模型预测电流控制和空间矢量脉宽调制策略,所提方法在保证控制性能的同时降低了功率器件结温,延长了寿命。Junction temperature is a key factor affecting the life of IGBT(Insulated-Gate Bipolar Transistor).In order to improve the life of two-level inverters,an improved Model Predictive Current Control(MPCC)strategy is proposed.Firstly,according to the power loss generation principle,the loss factor of the IGBT module is established.Secondly,considering the three-phase current direction and the conduction of different power tubes,different loss factors are added to the IGBT switch and the on-time to control the generation of power loss.Simulation results show that compared to traditional model predictive current control and space vector pulse width modulation strategies,the proposed method not only ensures control performance,but also reduces the junction temperature of power devices and improves their lifetime.

关 键 词：结温 寿命 模型预测电流控制 IGBT 损耗因子 

分 类 号：U266[机械工程—车辆工程]