检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:王青玲 WANG Qingling(Southwest China Institute of Electronic Technology,Chengdu 610036,China)
机构地区:[1]中国电子科技集团公司第十研究所,四川成都610036
出 处:《电子质量》2023年第5期95-99,共5页Electronics Quality
摘 要:分析了开展航空机载设备测试性设计的目的和意义,对设备的测试性设计流程、设计方法、试验验证和指标评估等方法进行了探讨。首先,具体描述了机载设备的BIT设计方法;其次,对典型功能电路采用的BIT方法和复杂电子器件采用的边界扫描测试性设计进行了介绍,肯定了测试性试验对装备测试性指标评估的作用;然后,对测试性设计中常见问题提出了解决措施;最后,指出装备应持续改进测试性设计以达成用户要求。The purpose and significance of carrying out the testability design for aviation airborne equipment are analyzed,and the testability design process,design method,test verification and index evaluation for the equipment are discussed.Firstly,the BIT design method for airborne equipment is described in detail.Secondly,the BIT method used for typical functional circuits and the boundary scanning testability design used for complex electronic devices are introduced,and the role of testability testing for equipment testability index evaluation is affirmed.Then,the solutions to common problems in testability design are put forward.Finally,it is pointed out that the equipment should be improved continuously to achieve the user's requirements.
分 类 号:TB114.32[理学—概率论与数理统计]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:3.136.37.101