基于FPGA的IC自动测试系统设计  

Design of IC Automatic Testing System Based on FPGA

作　　者：陈道泉[1] CHEN Daoquan(Zhejiang Institute of Mechanical and Electrical Engineering,Hangzhou 310051,China)

机构地区：[1]浙江机电职业技术学院,浙江杭州310051

出　　处：《安徽电子信息职业技术学院学报》2023年第2期1-6,共6页Journal of Anhui Vocational College of Electronics & Information Technology

基　　金：浙江省教育厅一般科研课题“基于FPGA的IC自动测试系统及其监控云平台关键技术研究”(Y202249623)。

摘　　要：基于FPGA技术设计了一种IC自动测试系统,通过总线通信的优化实现了板卡的柔性化组合与拓展。系统能自动识别槽位上的模块型号,并按系统CONFIG要求分配资源。实践表明,该系统可满足数字类IC和模拟类IC的量产测试需求,适用于IC的芯片验证测试和出厂成品测试;运行平稳、安全可靠,为集成电路测试设备的国产化、数字化和网络化提供了切实可行的解决方案。An IC automatic testing system based on FPGA technology has been designed,which achieves flexible combination and expansion of boards through optimization of bus communication.The system can automatically identify the module model on the slot and allocate resources according to the system CONFIG requirements.Practice has shown that this system can meet the mass production testing requirements of digital and analog ICs,and is suitable for chip verification testing and factory finished product testing of ICs.It runs smoothly,safely,and reliably,providing a practical and feasible solution for the localization,digitization,and networking of integrated circuit testing equipment.

关 键 词：FPGA IC测试 柔性化测试 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]