红外探测器多余物的危害及预防  

Redundant Object Damage and Prevention Method for Infrared Detectors

作　　者：雷永畅 李建林[1] 董伟[1] 周嘉鼎 侯礼坤 钱昆伦 LEI Yongchang;LI Jianlin;DONG Wei;ZHOU Jiading;HOU Likun;QIAN Kunlun(Kunming Institute of Physics,Kunming 650223,China)

机构地区：[1]昆明物理研究所,云南昆明650223

出　　处：《红外技术》2023年第7期790-797,共8页Infrared Technology

摘　　要：多余物引起航天、航空产品发生故障的案例有很多。红外探测器多余物的动态位移,会导致瞬时闪现的圆形影像故障,干扰红外弱小目标检测识别与跟踪;或者碰撞焦平面阵列产生无效像元,影响热成像系统的最小可分辨温差和作用距离。通过分步拆卸查找故障器件内的可排除宏观微粒,运用扫描电镜检测识别多余物,梳理制造过程和使用过程中出现多余物的来源和产生过程,提出必须从生产源头预防和控制多余物的途径和方法。力学和光学分析计算表明,宏观微粒破坏成像光束在焦平面上的光强分布,它位移掠过视场的时间小于50 ms,线度小于1mm衍射现象显著,圆形影像大多发生在夫琅禾费衍射区域,线度10μm大小的多余物靠近焦平面阵列产生菲涅耳衍射斑。Damage caused by foreign objects is a common risk faced by aerospace and aviation products,which has contributed to many incidents.The dynamic displacement of redundant objects can cause instantaneous circular image failure in infrared(IR)detectors,which interferes with the detection and tracking of small targets with low infrared radiation.Moreover,the dynamic displacement of redundant objects can collide with the infrared focal plane array,causing ineffective pixels and affecting the minimum resolvable temperature difference and operating range of the IR imager.The faulty device must be dismantled step-by-step to eliminate the macroparticles.Electron microscopy was used to test the redundant objects.The source and generation of redundant objects during infrared focal plane array manufacturing and application were determined.Mechanical and optical analyses show that macroparticles can damage the intensity distribution of the imaging beam on the focal plane.The time required for the displacement to pass through the field of view is less than 50 ms,the linearity is less than 1 mm,and the diffraction phenomenon is significant.Most of the circular images occurred in the Fraunhofer diffraction area.A fringe diffraction spot is produced if the 10mm redundant object is close to the focal plane array.

关 键 词：质量控制 过程方法 多余物 红外探测器 杜瓦瓶 

分 类 号：TN215[电子电信—物理电子学]