基于集成电路测试程序移植开发技术研究  

Research on Porting Development Technology Based on Integrated Circuit Test Programs

作　　者：段文辉 黄鹏 唐锐[1] 李军求 DUAN Wenhui;HUANG Peng;TANG Rui;LI Junqiu(CEPREI,Guangzhou 511370,China)

机构地区：[1]工业和信息化部电子第五研究所,广东广州511370

出　　处：《电子产品可靠性与环境试验》2023年第3期97-102,共6页Electronic Product Reliability and Environmental Testing

摘　　要：主要介绍了将V93000 Pin Scale系列SmarTest 6版开发环境中已完成的测试程序,移植开发至Smart Scale系列SmarTest 7版的实现方法。进一步地探讨了测试程序移植过程中普遍存在的技术问题及对应解决方法,通过对该项技术的研究可以让企业根据生产测试需求优化不同型号V93000设备的机时,缩短生产周期,节约生产成本,提升企业产值。The implementation method of porting the completed test program from the V93000 Pin Scale series SmarTest 6 development environment to Smart Scale series SmarTest 7 is mainly introduced.Further,the technical problems prevailing in the process of test program transplantation and the corresponding solutions are discussed.The study of this technology allows enterprises to optimize the machine hours of different models of V93000 equipment according to production test requirements,shorten the production cycles,save production costs and improve enterprise output.

关 键 词：集成电路 测试程序 移植开发 V93000 SmarTest 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]