基于计算机视觉的嵌入式数字IC芯片引脚缺陷检测方法  

A computer vision-based method for detecting pin defects of embedded digital IC chips

作　　者：邓承洋 DENG Chengyang(Chongqing Chuanyi Control System Co.,Ltd.,Shanghai Branch,Shanghai 201204,China)

机构地区：[1]重庆川仪控制系统有限公司上海分公司,上海201204

出　　处：《技术与市场》2023年第8期56-59,64,共5页Technology and Market

摘　　要：针对芯片引脚缺陷故障难以精准检测的现状,提出基于计算机视觉的嵌入式数字IC芯片引脚缺陷检测方法。采用计算机视觉技术计算相机水平方向的像素,采集嵌入式数字IC芯片引脚图像;对引脚图像进行图像预处理、引脚缺陷特征提取及缺陷定位处理;计算芯片引脚长度均值,以引脚长度均值为依据进行缺陷检测。试验结果表明:该检测方法在芯片引脚缺失、歪脚、不合格等方面检测结果的准确率得到了显著提高。A computer vision-based embedded digital IC chip pin defect detection method is proposed to address the current situation of difficulty in accurately detecting chip pin defects.Using computer vision technology to calculate pixels in the hor-izontal direction of the camera and collect pin images of embedded digital IC chips;perform image preprocessing,pin defect feature extraction,and defect localization on pin images;calculate the average length of chip pins and conduct defect detec-tion based on the average length of pins.Experimental analysis shows that the detection method has significantly improved the accuracy of detection results in areas such as missing,skewed,and unqualified chip pins.

关 键 词：计算机视觉 嵌入式数字IC芯片 引脚缺陷检测 缺陷特征提取 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术] TN40[自动化与计算机技术—计算机科学与技术]