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作 者:刘保军 张爽 李成 LIU Bao-jun;ZHANG Shuang;LI Cheng(Aviation Maintenance NCO Academy,Air Force Engineering University,Xinyang,Henan 464000,China;Institute for Quantum Information&State Key Laboratory of High Performance Computing,College of Computer,National University of Defense Technology,Changsha,Hunan 410073,China)
机构地区:[1]空军工程大学航空机务士官学校,河南信阳464000 [2]国防科技大学计算机学院高性能计算国家重点实验室,湖南长沙410073
出 处:《电子学报》2023年第6期1637-1643,共7页Acta Electronica Sinica
基 金:国家自然科学基金(No.11975311,No.11405270)。
摘 要:碳纳米材料互连线由于其良好的电学、热学和力学特性,成为研究热点.随着技术节点的缩减,串扰效应对电路的影响愈加显著.本文针对单壁碳纳米管束(Single Walled Carbon Nanotube Bundles,SWCNT)、多壁碳纳米管束(Multi Walled Carbon Nanotube Bundles,MWCNT)、单层石墨烯(Single Layer Graphene Nano-Ribbon,SLGNR)及多层石墨烯(Multi Layer Graphene Nano-Ribbon,MGLNR)的互连线,研究了统一的等效RLC模型,并构建了单粒子串扰(SEC)的等效电路,对比分析了四种互连线在32 nm,21 nm和14 nm技术节点下的SEC峰值电压和脉冲宽度.结果表明,与铜互连线相比,碳纳米材料互连线的SEC较弱,但对传输信号的衰减作用较大,综合信号衰减和耦合作用程度,SWCNT和MLGNR更能有效抑制SEC的传播和影响.最后,本文利用灰色理论,分析了SEC与RLC参数之间的潜在关联性.Due to its well electrical,thermal and mechanical properties,carbon nanomaterial interconnect has become a research hotspot.As devices feature sizes scale down into nano meter,single event transient(SET)becomes the most seri⁃ous threat for the reliability of integrated circuits(ICs)with advanced process in the future,which should be highly con⁃cerned.With CMOS technology scaling continuing and operating frequencies increasing,SET might bring noise into elec⁃tronically unrelated multiple logic circuit paths due to increased crosstalk effects between interconnects,which can intensify the SET susceptibility of nanometer CMOS circuits.Therefore,single event crosstalk(SEC)effects should be considered carefully in the early design stages of circuits applied for space and ground radiation environments.As technology nodes scaled down,the impact of crosstalk effects on the integrated circuits becomes more and more significant.Although many works have been carried out on the crosstalk effect of carbon nanomaterial interconnects,the conclusions obtained cannot well guide the analysis and research of the radiation effect of integrated circuits of carbon nanomaterial interconnects.For single-walled carbon nanotube bundles(SWCNT),multi-walled carbon nanotube bundles(MWCNT),single-layer graphene(SLGNR)and multilayer graphene(MGLNR)interconnects,a unified equivalent RLC model is studied.The equivalent cir⁃cuit of single event crosstalk(SEC)is built.The SEC peak voltage and pulse width of four interconnects at 32 nm,21 nm and 14 nm technology nodes are compared and analyzed.The results show that,compared with the copper interconnect,the SEC of the carbon nanomaterial interconnects is smaller,but has a greater attenuation effect on the transmission signal.This results in a lower peak voltage and a larger pulse width of SEC.With the technology node scaling down from 32 nm to 14 nm,the peak voltage of SEC tends to increase,and the pulse width of SEC changes insignificantly,except for SW⁃CNT and MLGNR.The peak voltage of SE
分 类 号:TN406[电子电信—微电子学与固体电子学] TN405.97
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