基于ATE的传输延迟测试方法优化  

Transmission delay test optimization based on ATE

作　　者：李灿 韩先虎 程法勇 郭晓宇[1] 王建超[1] LI Can;HAN Xianhu;CHENG Fayong;GUO Xiaoyu;WANG Jianchao(The 58th Research Institude of China Electronics Technology Group Corporation,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《现代电子技术》2023年第20期39-43,共5页Modern Electronics Technique

摘　　要：目前利用数模混合集成电路自动测试机(ATE)测试系统测试纳秒级传输延迟时,由于信号发生单元驱动能力限制,多采用程控外接仪器进行测试,大批量测试时无法满足生产需求。文中介绍数模混合集成ATE测试系统的工作架构和传输延迟时间的测试原理,分析了基于数模混合ATE测试系统的时间测量单元(TMU)的工作原理和采用程控外接仪器的时间测试方法,通过对两种测试方法的对比,总结了优化TMU测试方法取代程控外接仪器的必要性。以MOSFET为研究对象,研究导致传输延迟测量误差的原因,通过增强ATE的信号驱动能力优化了TMU测试方法。试验结果表明,优化后传输延迟测试方法与MOSFET器件规范中的典型值基本一致,并且提高了测试效率,满足了大批量测试的需求。At present,when using the digital analog mixed ATE(automatic test equipment)testing system to test the nanosecond transmission delay,the programmable external instruments are mostly used for testing due to the limitation of the driving capacity of the signal generation unit,which cannot meet the production requirements in mass testing.The working architecture of the digital analog hybrid integrated ATE test system and the test principle of the transmission delay time are introduced,the working principle of the time measurement unit(TMU)based on the digital analog hybrid ATE test system and the time testing method using programmable external instruments are analyzed.By the comparison of the two test methods,the necessity of optimizing the TMU test method to replace the programmable external instruments is summarized.Taking MOSFET as the research objects,the causes of transmission delay measurement error are researched.The TMU test method is optimized by enhancing the signal driving ability of ATE.The testing results show that the optimized transmission delay test method is basically consistent with typical value in the MOSFFT device specification,and the test efficiency is improved,which can meet the requirements of mass testing.

关 键 词：自动测试设备(ATE) 传输延迟 集成电路 程控 时间测量单元(TMU) MOSFET 

分 类 号：TN47-34[电子电信—微电子学与固体电子学] TN407