基于ATE的Nand Flash功能测试优化方法  

Nand Flash Function Test Optimization Method Based on ATE

作　　者：谈元伟 韩森 李斌[1] 李敬胶 TAN Yuanwei;HAN Sen;LI Bin;LI Jingjiao(The 58th Research Institute of CETC,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《电子质量》2023年第9期34-37,共4页Electronics Quality

摘　　要：针对利用自动测试设备测试Nand Flash电路的功能时,遇到坏块就会判定Nand Flash功能失效的问题,对Nand Flash功能测试优化方法进行了研究,使用自动测试设备(ATE)测试系统的紧凑型故障存储器(CFM)的功能,通过纠错码(ECC)将测试结果实时捕获到CFM中,测试程序从CFM中即可读取测试通过或者失败的判断,从而可以更加清晰地判别电路存储单元的性能,解决了在测试Nand Flash电路过程中遇到坏块就判定其功能失效的问题。When using automatic test equipment to test the function of Nand Flash circuit,the automatic test equipment will determine the failure of Nand Flash circuit function when the bad block is encountered.Aiming at the problem,the optimization method of Nand Flash circuit function test is studied.Using the CFM function of ATE test system,the test results are captured to CFM in real time through ECC.The test program can read the judgment of the test pass or failure from FCM,so that the performance of the circuit storage unit can be more clearly identified,and the problem of determing the function failure when the bad block is encountered in the process of testing the Nand Flash circuit is solved.

关 键 词：Nand Flash 自动测试设备 纠错码 紧凑型故障存储器 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]