基于相位掩模的粒子三维定位  

Three-dimensional particles localization based on phase mask

作　　者：徐基科 朱巧芬 张岩[2] XU Jike;ZHU Qiaofen;ZHANG Yan(School of Mathematics and Physics Science and Engineering,Hebei University of Engineering,Hebei Computational Optical Imaging and Photoelectric Detection Technology Innovation Center,and Hebei International Joint Research Center for Computational Optical Imaging and Intelligent Sensing,Handan 056038,China;Department of Physics,Capital Normal University,Beijing 100048,China)

机构地区：[1]河北工程大学数理科学与工程学院,河北省计算光学成像与光电检测技术创新中心,河北省计算光学成像与智能传感国际联合研究中心,河北邯郸056038 [2]首都师范大学物理系,北京100048

出　　处：《光学技术》2023年第5期540-543,共4页Optical Technique

基　　金：邯郸市科学技术研究与发展计划(19422031008-5)。

摘　　要：快速、精确地对粒子进行三维定位在生命科学、材料科学、工业检测等领域具有重要的应用价值。传统的粒子定位方法由于运算量繁重,难以满足快速、精确的需求。文章提出了一种新的基于相位掩模的粒子三维定位方法。采用Fienup优化算法设计位于4f系统频谱面上的相位掩膜,针对不同深度的点光源获得一系列点扩散函数;结合粒子位置和所成图像进行神经网络训练,可在8μm轴向范围内经单次测量实现目标粒子在三维空间中的高精度定位。两组模拟设计的数值结果表明所提方法能够快速高效地完成稀疏粒子的三维定位,在细胞粒子成像定位等方面具有重要的应用价值。Rapid and accurate three-dimensional positioning of particles has important applications in life science,material science,industrial detection,and other fields.The traditional particle location methods cannot meet the requirement of fast and accurate because of heavy computation.A new 3D particle locating method based on phase mask is proposed.Fienup optimization algorithm was used to design the phase mask on the spectrum plane of a 4f imaging system,and a series of point spread functions were obtained for different depth of point light sources.By training the neural network based on the particle positions and generated images,the target particle can be located in 3D space with high precision by a single measurement within the axial range of 8μm.Numerical simulation results of two sets of design show that the proposed method can quickly and efficiently complete the three-dimensional locating of sparse particles,and may have important applications in the locating of cell particles.

关 键 词：三维定位 点扩散函数 Fienup优化算法 神经网络 4f系统 

分 类 号：O438[机械工程—光学工程]