基于ATE的千兆以太网收发器芯片测试方法  

Gigabit Ethernet Transceiver Chip Testing Method Based on ATE

作　　者：谢凌峰 武新郑[1] 王建超[1] XIE Lingfeng;WU Xinzheng;WANG Jianchao(China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《电子与封装》2023年第11期12-17,共6页Electronics & Packaging

摘　　要：千兆以太网收发器芯片是一种最高能支持1000 Mbit/s传输速率的高速接口芯片。介绍了该类芯片的功能、硬件配置,针对ATE测试机台设计了相应的外围电路,在ATE测试机台上进行了寄存器读写测试和回环测试,利用测试机抓取了千兆以太网芯片输出的数据,测试结果验证了千兆以太网收发器芯片的功能正确性。Gigabit Ethernet transceiver chip is a kind of high-speed interface chip,which supports up to 1000 Mbit/s transmission rate.The functions and hardware configurations of this kind of chip are introduced.Corresponding peripheral circuits are designed for ATE test bench.Register read/write tests and loopback tests are completed on the ATE test bench.Output data of the Gigabit Ethernet chip is captured by the test bench,and test results verify the correctness of the functions of the Gigabit Ethernet transceiver chip.

关 键 词：千兆以太网收发器芯片 寄存器读写测试 回环测试 ATE 

分 类 号：TN407[电子电信—微电子学与固体电子学] TP23[自动化与计算机技术—检测技术与自动化装置]