核电子学与核仪器中多步ADC的测试和校准  

Testing and Calibration of Multi-step ADC in Nuclear Electronicsand Instrumentation

作　　者：杨静 李正民[2] YANG Jing;LI Zhengmin(ZhengZhou Shengda University of Economics,Business&Management,Zhengzhou 451191,China;ZhengZhou University,Zhengzhou 450001,China)

机构地区：[1]郑州升达经贸管理学院,郑州451191 [2]郑州大学,郑州450001

出　　处：《核电子学与探测技术》2023年第4期675-683,共9页Nuclear Electronics & Detection Technology

基　　金：河南省重点研发与推广专项(202102210140)资助。

摘　　要：针对核电子学与核仪器中的多步模拟-数字变换器的测试和校准进行了研究。提出了基于工艺变化监测的校准思想和对于每一级的主要静态误差源即系统判决级偏移误差、级增益误差和内部参考电压误差的双残差信号处理方案。针对多级电路的校准提出了一种基于最速下降法的校准算法,通过比较估计输出和期望响应实现估计误差的创建。并针对基于模具级工艺监测器和温度传感器的工艺变化监测提出了两种估计算法,从而实现整个多步ADC的全量程测试和校准。The testing and calibration of multi-step analog to digital converter(ADC)in nuclear electronics and nuclear instruments are studied.A calibration idea based on process variation monitoring is proposed,and a dual residual signal processing scheme is proposed for the main static error sources of each stage,namely the system decision level offset error,stage gain error and internal reference voltage error.A calibration algorithm based on steepest descent method is proposed for the calibration of multi-stage circuits,and the estimation error is created by comparing the estimated output with the expected response.Two estimation algorithms are proposed for process variation monitoring based on die-level process monitor and temperature sensor,so as to realize the full range testing and calibration for the whole multi-step ADC.

关 键 词：核电子学 核仪器 模拟-数字变换器 静态误差 工艺变化监测 双残差处理 最速下降法 测试/校准 

分 类 号：TN407[电子电信—微电子学与固体电子学]