电源模块在老炼试验中的使用  

The Use of Power Module in Burn-in Test

作　　者：周杰 徐伟伟 陈真[1] ZHOU Jie;XU Weiwei;CHEN Zhen(No.58 Research Institute of CETC,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《电子质量》2023年第11期89-92,共4页Electronics Quality

摘　　要：芯片老炼试验过程中,需要对芯片进行不间断供电,以保持芯片稳定运行。随着新研制芯片的功率越来越大,一块载板上需要放置很多芯片同时进行老炼,就需要我们在供电方面进行优化。首先,结合工作中遇到的一些项目实例,具体阐述了用电源模块对芯片进行供电的方法;其次,分析说明了通过电源模块供电,可以减少电压源等供电设备的使用,同时减轻操作人员的工作强度;最后,简单地介绍了线性稳压电源和开关模式电源两种电源模块,给出了一些选择的建议,以此希望可以给进行硬件设计的老炼工程师一些帮助。In the process of chip burn-in test,it is necessary to provide uninterrupted power supply to the chip to maintain its stable operation.With the increasing power of the newly developed chips,many chips need to be placed on the carrier board for burn-in at the same time,which requires us to optimize the power supply.First of all,combined with some object examples encountered in the work,the method of using power module to power the chip is described in detail.Secondly,it is analyzed that power supply equipment such as voltage source,and reduce the work intensity of operators.Finally,the two kinds of LDO and DCDC power modules are introduced briefly,and some suggestions for selection are give,in hope that it can give some help to the burn-in engineers for hardware design.

关 键 词：老炼 供电 电源模块 线性稳压电源 开关模式电源 

分 类 号：TN41[电子电信—微电子学与固体电子学]