DSP芯片动态老炼系统设计与实现  

Design and implementation of dynamic burn⁃in system for DSP chips

作　　者：王涛[1] 钱昀莹 韦凯[1] 田旭[2] WANG Tao;QIAN Yunying;WEI Kai;TIAN Xu(The 58th Research Institute of China Electronics Technology Group Corporation,Wuxi 214062,China;School of Mechanical and Electrical Engineering,China University of Mining and Technology(Beijing),Beijing 100083,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214062 [2]中国矿业大学(北京)机械与电气工程学院,北京100083

出　　处：《电子设计工程》2024年第1期15-18,23,共5页Electronic Design Engineering

基　　金：国家自然科学基金(51707194)。

摘　　要：在集成电路的可靠性筛选试验中,老炼试验是最重要和最有效的试验。针对静态老炼和传统动态老炼方式的局限性,提出了一种DSP芯片动态老炼系统的设计与实现方法。该动态老炼系统实现了老炼程序自动加载,可以实时监测每个工位老炼试验情况,将老炼过程中发现的失效电路及时剔除,试验结果可以自动存储,便于后期进行试验结果分析。相比静态老炼和传统动态老炼方式,该系统测试覆盖率更高,提高了产品可靠性。In the reliability screening test of integrated circuits,burn⁃in test is the most important and effective test.A design and implementation method of dynamic burn⁃in system for DSP chips is proposed to address the limitations of static burn⁃in and traditional dynamic burn⁃in methods.This dynamic burn⁃in system realizes automatic loading of burn⁃in programs,which can monitor the burn⁃in test status of each workstation in real⁃time.It can timely remove any failed circuits found during the burn⁃in process,and the test results can be automatically stored for later analysis of test results.Compared to static burn⁃in and traditional dynamic burn⁃in methods,dynamic burn⁃in testing has higher coverage and improves product reliability.

关 键 词：DSP 动态老炼 自动加载 可靠性 

分 类 号：TN911.72[电子电信—通信与信息系统]