碳化硅材料热扩散系数的外推法应用研究  

Application of extrapolation to the thermal diffusivity of silicon carbide materials

作　　者：张忠胜 张霞 丁文皓 王惠馨 ZHANG Zhong-sheng;ZHANG Xia;DING Wen-hao;WANG Hui-xin(Shandong Nonmetallic Materials Institute,Jinan 250000,China)

机构地区：[1]山东非金属材料研究所,济南250000

出　　处：《炭素》2023年第3期8-12,共5页Carbon

摘　　要：随着计算机技术、微电子技术和激光技术的快速发展,为实现非稳态法中的激光闪光法测量提供了良好的技术支持。本文利用NETZSCHLFA427设备在室温环境下,通过改变电压强度和脉冲宽度的值,得到一系列碳化硅材料的等效热扩散系数,通过外推法得到样品的固有热扩散系数。其次,探究了碳化硅样品厚度对热扩散系数测量结果的影响,从热穿透深度的角度解释了不同厚度样品测量结果偏差的原因,并给出了样品厚度的选择原则。同时解释了在高脉冲积分下,测得样品热扩散系数结果偏小的原因,由此可说明,通过实验测量和理论外推相结合的方法,得到了更准确的热扩散系数结果。With the rapid development of computer technology,microelectronics technology and laser technology,it provides good technical support for the realization of laser flash method measurement in the non-stationary method.In this paper,the equivalent thermal diffusivities of a series of silicon carbide materials are obtained by changing the values of voltage intensity and pulse width using a NETZSCH LFA 427 device in a room temperature environment,and the intrinsic thermal diffusivities of the samples are obtained by extrapolation.Secondly,the influence of the thickness of the silicon carbide samples on the thermal diffusivity measurement results is explored,the reasons for the deviation of the measurement results of different sample thicknesses are explained from the perspective of the thermal penetration depth,and the principles for the selection of the sample thicknesses are given.At the same time,the reason for the small thermal diffusivity results of the samples measured under high pulse integration is explained,which can show that the combination of experimental measurement and theoretical extrapolation is more accurate thermal diffusivity is obtained.

关 键 词：激光闪光法 碳化硅材料 热扩散系数 外推法 热穿透深度 

分 类 号：TQ163.4[化学工程—高温制品工业]