一种基于C单元的三节点翻转自恢复锁存器  

A triple-node-upset self-recovery latch using C-element

作　　者：徐辉[1] 朱烁 孙皓洁 马瑞君 梁华国 黄正峰 XU Hui;ZHU Shuo;SUN Hao-jie;MA Rui-jun;LIANG Hua-guo;HUANG Zheng-feng(School of Computer Science and Engineering,Anhui University of Science and Technology,Huainan 232001;School of Microelectronics,Hefei University of Technology,Hefei 230009,China)

机构地区：[1]安徽理工大学计算机科学与工程学院,安徽淮南232001 [2]合肥工业大学微电子学院,安徽合肥230009

出　　处：《计算机工程与科学》2024年第1期37-45,共9页Computer Engineering & Science

基　　金：国家自然科学基金(61834006,61874156,61404001);国家重大科研仪器研制项目(62027815)。

摘　　要：随着集成电路中工艺尺寸的不断缩减,锁存器也越来越容易受到粒子辐射引起的三节点翻转的影响。针对该问题,基于C单元的结构,提出一种低功耗、低延时和高鲁棒性的三节点翻转并自恢复的MKEEP锁存器。通过仿真实验和PVT的波动实验表明,相对于其他拥有三节点容忍或自恢复能力的锁存器,该锁存器拥有低功耗、低延迟和更小的面积开销,且对工艺、电压和温度的敏感度较低,优势明显。With the persistent reduction of process size in integrated circuits,latches are also more and more vulnerable to the influence of triple-node-upset caused by particles radiation.Aiming at this problem,a triple-node-upset tolerance and self-recovery MKEEP latch based on C-element with low power consumption,low delay and high robustness is proposed.Simulation experiments and PVT fluctuation experiments show that,compared with other latches with triple-node-upset tolerance or self-recovery capability,the proposed latch has lower power consumption,low delay and area overhead.At the same time,this latch is less sensitive to process,voltage and temperature,and has obvious advan-tages than referenced latches.

关 键 词：粒子辐射 三节点翻转 锁存器 自恢复 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]