扫描电镜中半导体制冷冷台使用条件优化及在高含水量样品中的应用  

Optimization of semiconductor refrigeration cold stage usage conditions and its application in high moisture content samples in scanning electron mmicroscopy

作　　者：陈惜燕[1] 魏兰兰[1] 康靖全[1] 段慧[1] 范宁娟[1] CHEN Xiyan;WEI Lanlan;KANG Jingquan;DUAN Hui;FAN Ningjuan(College of Life Sciences,Northwest A&F University,Xianyan,Shaanxi 712100,China)

机构地区：[1]西北农林科技大学生命科学学院,陕西咸阳712100

出　　处：《食品与机械》2023年第12期18-22,共5页Food and Machinery

基　　金：西北农林科技大学实验技术研究与实验室管理创新项目(编号:SY20210211)。

摘　　要：目的:有效解决高含水量样品电子显微结构观察的难点。方法:通过常规扫描电子显微镜搭配半导体制冷冷台的新仪器组合模式,对一系列高含水量样品进行显微结构观察。结果:高含水量样品在以导电胶带为基质,电压5 kV,电子束斑值为50/60,冷台温度为4℃的条件下,无需对样品进行固定和脱水处理,可以在扫描电子显微镜下直接成像观察其显微结构,样品微观结构没有皱缩、拉伸、扭曲等变形现象,能够更真实地反映样品的原貌。结论:常规扫描电子显微镜搭配半导体制冷冷台的仪器自由组合模式是解决高含水量样品显微结构观察的有效手段。Objective:To effectively solve the difficulty of observing the electron microstructure of samples with high water content.Methods:A series of samples with high water content were observed by conventional scanning electron microscope with a new mode instrument combination of semiconductor cold cooling table.Results:Under the conditions of conductive tape as matrix,voltage 5 kV,electron beam spot of 50 or 60,and cold table temperature of 4℃,the sample with high water content did not need to be fixed and dehydrated,and its microstructure could be directly imaged under the scanning electron microscope to observe its microstructure.The microstructure of the sample hadd no deformation phenomena such as shrinkage,stretching and distortion,which could reflect the original appearance of the sample more realistically.Conclusion:The new mode of free combination of conventional scanning electron microscope with semiconductor cold cooling table is an effective means to solve the microstructure observation of high water content samples,and is an economical,cost-effective and widely adaptable mode.

关 键 词：扫描电镜 冷冻扫描电镜 环境扫描电镜 半导体制冷冷台 束斑 高含水生物样品 

分 类 号：TN16[电子电信—物理电子学]