Characterizing and controlling infrared phonon anomaly of bilayer graphene in optical-electrical force nanoscopy  

作　　者：Junghoon Jahng Sunho Lee Seong-Gu Hong Chang Jun Lee Sergey G.Menabde Min Seok Jang Dong-Hyun Kim Jangyup Son Eun Seong Lee 

机构地区：[1]Hyperspectral Nano-imaging Team,Korea Research Institute of Standards and Science,Daejeon 34113,Republic of Korea [2]Department of Aerospace Engineering,University of Illinois at Urbana-Champaign,Urbana,IL 61801,USA [3]Multiscale Mechanical Properties Measurement Team,Korea Research Institute of Standards and Science,Daejeon 34113,Republic of Korea [4]School of Mechanical Engineering,Chonnam National University,Gwangju 61186,Republic of Korea [5]School of Electrical Engineering,Korea Advanced Institute of Science and Technology,Daejeon 34141,Republic of Korea [6]Functional Composite Materials Research Center,Korea Institute of Science and Technology,Jeonbuk 55324,Republic of Korea [7]SKKU Advanced Institute of Nanotechnology,Sungkyunkwan University,Suwon 16419,Republic of Korea [8]Division of Nano&Information Technology,KIST School,University of Science and Technology,Seoul 02792,Republic of Korea

出　　处：《Light(Science & Applications)》2023年第12期2700-2710,共11页光（科学与应用)（英文版）

基　　金：support of the KPFM calibration.J.J.,S.L.and E.S.L.acknowledge the supports from the National Research Foundation of Korea(NRF)grant(MSIT;Grant No.2022R1C1C1008766);the Nano Material Technology Development Program(Grant No.2016M3A7B6908929)funded by the Korea government.S.G.M.;M.S.J.acknowledge the Basic Science Research Program through the NRF funded by the Ministry of Education(Grant No.2021R1I1A1A01057510);the support of the NRF grant funded by MSIT(2022R1A2C2092095).D.K.;J.S.acknowledged to the National Research Council of Science&Technology(NST)grant by the Korea government(MSIT)(No.CRC-20-01-NFRI)and the KIST Institutional program(2E32634).

摘　　要：We,for the first time,report the nanoscopic imaging study of anomalous infrared(IR)phonon enhancement of bilayer graphene,originated from the charge imbalance between the top and bottom layers,resulting in the enhancement of E1u mode of bilayer graphene near 0.2 eV.We modified the multifrequency atomic force microscope platform to combine photo-induced force microscope with electrostatic/Kelvin probe force microscope constituting a novel hybrid nanoscale optical-electrical force imaging system.This enables to observe a correlation between the IR response,doping level,and topographic information of the graphene layers.Through the nanoscale spectroscopic image measurements,we demonstrate that the charge imbalance at the graphene interface can be controlled by chemical(doping effect via Redox mechanism)and mechanical(triboelectric effect by the doped cantilever)approaches.Moreover,we can also diagnosis the subsurface cracks on the stacked few-layer graphene at nanoscale,by monitoring the strain-induced IR phonon shift.Our approach provides new insights into the development of graphene-based electronic and photonic devices and their potential applications.

关 键 词：ELECTRICAL FORCE OPTICAL 

分 类 号：TQ127.11[化学工程—无机化工]