集成电路测试数据分析系统的设计与实现  

Design and Implementation of an Integrated Circuit Test Data Analysis System

作　　者：陈光胜 CHEN Guangsheng(Shanghai Eastsoft Microelectronics Co.,Ltd.,Shanghai 200235,China.)

机构地区：[1]上海东软载波微电子有限公司,上海200235

出　　处：《集成电路应用》2024年第2期52-56,共5页Application of IC

摘　　要：阐述集成电路芯片测试数据治理的关键因素,探讨测试数据大规模化、测试数据多样性、测试数据一致性所面临的技术挑战,从而全面了解集成电路测试数据的数据质量重要性。通过案例分析,提出有效的实施策略。同时,围绕集成电路测试数据所面临的数据质量问题,挖掘数据质量特征,通过数据质量的主要评价标准及技术效果,提出和实施可行的数据治理方案。This paper describes the key factors in the governance of test data for integrated circuit chips,explores the technical challenges faced by large-scale,diverse,and consistent test data,and comprehensively understands the importance of data quality in integrated circuit test data.Through case analysis,it proposes effective implementation strategies.At the same time,it focuses on the data quality issues faced by integrated circuit testing data and explores data quality characteristics.Based on the main evaluation criteria and technical effects of data quality,it proposes and implements feasible data governance plans.

关 键 词：集成电路测试 测试数据分析 数据质量 数据质量特征 

分 类 号：TN407[电子电信—微电子学与固体电子学]