一种校准线延时差异的方法分析  

Analysis of a Method for Measuring Delay Differences in Calibration Lines

作　　者：刘文江 杨超 曲狄 LIU Wenjiang;YANG Chao;QU Di(Shanghai Fuhan Microelectronics Co.,Ltd.,Shanghai 200233,China)

机构地区：[1]上海富瀚微电子股份有限公司,上海200233

出　　处：《集成电路应用》2024年第3期30-32,共3页Application of IC

摘　　要：阐述一种在发送端通过自发自收的方式自动校准并行数据不同PIN延时的方法,可以有效提高接收芯片Clock和Data的相位裕度,降低因并行传输信号完整性指标较差,整个系统不稳定而出现花屏,闪屏的现象。This paper describes a method of automatically calibrating parallel data with different PIN delays through spontaneous self collection at the sending end,which can effectively improve the phase margin of the receiving chip Clock and Data,and reduce the phenomenon of screen flicker and flicker caused by poor integrity indicators of parallel transmission signals and instability of the entire system.

关 键 词：电路设计 BT656/BT1120 Skew校准 

分 类 号：TN702[电子电信—电路与系统] TP212[自动化与计算机技术—检测技术与自动化装置]