基于并行测试技术的信号处理组件测试系统设计  

Design of Signal Processor Test System Based on Parallel Test

作　　者：王秀霞[1] 叶园园 邓雪亚 WANG Xiuxia;YE Yuanyuan;DENG Xueya(China Airborne Missile Academy,Luoyang Henan 471000;Unit 93160 of PLA,Beijing 100071)

机构地区：[1]中国空空导弹研究院,河南洛阳471009 [2]中国人民解放军93160部队,北京100071

出　　处：《软件》2024年第4期181-183,共3页Software

摘　　要：为了解决信号处理组件生产中周期长、效率低等问题,本文设计了一种基于并行测试技术的测试系统,实现了单个测试周期内多任务的同时测试。该系统架构灵活性强,通用性高,可推广应用。In order to solve the problem of long cycle and low efficiency in the production of message processing components,a test system based on parallel testing technology is designed to realize the simultaneous testing of multiple tasks in a single test cycle.The system architecture is flexible and has high universality,which can be popularied and applied.

关 键 词：信号处理组件 并行测试 多任务 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]