关于电子元器件失效分析方法的讨论  

Analysis on Failure Analysis Methods for Electronic Components

作　　者：田磊 

机构地区：[1]珠海零边界集成电路有限公司,珠海519070 [2]珠海格力电器股份有限公司,珠海519070

出　　处：《日用电器》2024年第5期126-129,142,共5页ELECTRICAL APPLIANCES

摘　　要：电子元器件的失效分析是一个复杂而重要的任务。通过综合运用各种分析方法,我们可以更全面地了解元器件的失效原因,为后续的改进和优化提供有力的支持。同时,随着技术的不断进步,我们有望在未来开发出更加先进和高效的失效分析方法,为电子行业的发展做出更大的贡献。本文基于工作实践,通过对电子元器件失效的剖析,给出了一种电子元器件失效分析的方法和流程,供相关技术人员参考。Failure analysis of electronic components is a complex and important task.Through the comprehensive use of various analysis methods,we can understand the causes of component failure more comprehensively,and provide strong support for subsequent improvement and optimization.At the same time,with the continuous advancement of technology,we are expected to develop more advanced and efficient failure analysis methods in the future,and make greater contributions to the development of the electronics industry.Based on the work practice,this paper gives a method and process for the failure analysis of electronic components through the analysis of electronic component failure,which is for the reference of relevant technicians.

关 键 词：失效分析 芯片失效 自动测试设备 

分 类 号：TN60[电子电信—电路与系统]