某航天产品上移位寄存器的失效分析  

Failure Analysis of Shift Register on an Aerospace Product

作　　者：佘阳 龙俊 杨少华[1] 陆家乐 李劲 SHE Yang;LONG Jun;YANG Shaohua;LU Jiale;LI Jin(CEPREI,Guangzhou 511370,China;Guangdong Province Key Laboratory of Electonic Information Products Reliability Technology,Guangzhou 511370,China)

机构地区：[1]工业和信息化部电子第五研究所,广东广州511370 [2]广东省电子信息产品可靠性技术重点实验室,广东广州511370

出　　处：《电子产品可靠性与环境试验》2024年第3期25-29,共5页Electronic Product Reliability and Environmental Testing

摘　　要：通过加速贮存试验对某航天产品进行延寿,试验期间移位寄存器发生故障。为了确认移位寄存器失效的具体原因,利用光学显微镜观察、电特性测试、 X射线(X-ray)检查和扫描电镜分析方法对移位寄存器进行了分析,最终得出结论,认为该移位寄存器失效的主要原因是层间介质的机械损伤。The life extension of an aerospace product is carried out by accelerated storage test and the shift register fails during the test.In order to confirm the specific reasons for the failure of the shift register,the shift register is analyzed by using optical microscope observation,electrical characteristic test,X-ray inspection,scanning electron microscope,and finally it is concluded that the interlevel dielectric mechanical injury is the main reason for the failure of the shift register.

关 键 词：加速贮存试验 移位寄存器 层间介质 机械损伤 失效分析 

分 类 号：V467[航空宇航科学与技术—航空宇航制造工程]