无相互作用自由空间电子光学与量子电子显微镜  

Interaction⁃free electron optics in free space and quantum electron microscope

作　　者：赵利荣 崔益民[1] 彭腾飞 李文萍[1] ZHAO Lirong;CUI Yimin;PENG Tengfei;LI Wenping(Beihang University,Beijing 100191,China)

机构地区：[1]北京航空航天大学,北京100191

出　　处：《电子显微学报》2024年第3期362-370,共9页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.12375283).

摘　　要：本文围绕着生物等敏感样品的高分辨透射电子显微成像展开,从电子显微成像等方面论述了透射电子显微镜在敏感样品领域的发展,重点介绍了基于无相互作用测量(IFM)的量子电子相干成像机理,分析了自由空间电子光学中电子IFM对耦合相干电子源和耦合电子传输的要求,量子机制和电子显微镜相结合建立的量子电子显微镜能够从本质上解决高能电子辐照对生物等敏感样品的损伤,将成为敏感样品高分辨无损检测发展史上的里程碑。This paper focused on the imaging of sensitive samples such as biological ones by high-resolution transmission electron microscopy,which included the developments in the imaging method of electron beam.First,the mechanism of quantum electron coherent imaging based on the interaction-free measurement(IFM)was introduced in detail.Second,demands of the coupled coherent electron source and transportation of coherent electrons were given for electron IFM in free-space electron optics.Quantum electron microscope,established by combining electron microscope with quantum mechanism,can solve the radiation damage of high-energy electrons on sensitive samples in nature,which becomes a milestone in the high-resolution non-destructive testing of sensitive samples.

关 键 词：透射电子显微镜 无相互作用测量 自由空间电子光学 量子电子显微镜 

分 类 号：TN16[电子电信—物理电子学] O46[理学—电子物理学]