基于RS和BCH码的SRAM-PUF密钥提取方法及性能分析  

SRAM-PUF Key Extraction Method and Performance Analysis Based on RS and BCH Codes

作　　者：周昱 于宗光 ZHOU Yu;YU Zongguang(The 58th Research Institute,China Electronic Group Corporation,Wuxi 214072,Jiangsu,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214072

出　　处：《计算机工程》2024年第7期187-193,共7页Computer Engineering

摘　　要：物理不可克隆函数(PUF)是芯片制造过程中随机偏差形成的唯一和不可复制的物理指纹,使用这个特征可以鉴别各个芯片,然而PUF芯片因环境变化会影响输出,导致在认证应用时可能失败。介绍了模糊提取器的密钥提取方法,通过在静态随机存取存储器(SRAM)-PUF芯片中加入里德-所罗门(RS)硬解码,在认证系统中加入BCH软解码模块,纠正PUF在一定范围内变化来确保通过认证,并对SRAM-PUF电路在三温下进行实验分析。实验结果表明,SRAM-PUF电路的PUF点分布有较好的均衡性,在常温时可靠性接近100%,在低温条件下可靠性范围为98.84%~100%,在高温条件下,可靠性范围为97.77%~99%,当RS码和BCH码设计的纠错能力大于PUF可靠性时能够通过认证。The Physical Unclonable Function(PUF)is a unique and nonreplicable physical fingerprint formed by random deviations during chip manufacturing that can be used to identify individual chips.However,PUF chips may fail in authentication applications owing to environmental changes,which affect their output.This paper introduces a key extraction method for fuzzy extractors.By adding Reed-Solomon(RS)hard decoding to a Static Random Access Memory(SRAM)-PUF chip and a BCH soft decoding module to the authentication system,changes in the PUF within a certain range are corrected to ensure authentication.The performance of the SRAMPUF circuit at three temperatures is analyzed experimentally.The results show that the PUF point distribution of the SRAM-PUF circuit exhibits good balance,with the reliability approaching 100% at room temperature,98.84%-100% at low temperature,and 97.77%-99% at high temperature.Certification is passed when the errorcorrection ability of the RS and BCH codes exceeds that of the PUF.

关 键 词：物理不可克隆函数 静态随机存取存储器 模糊提取器 里德-所罗门码 BCH码 

分 类 号：TP309[自动化与计算机技术—计算机系统结构]