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作 者:Liling Sun Qi Wu Shu Cai Yang Ding Ho-kwang Mao
机构地区:[1]Center for High Pressure Science and Technology Advanced Research,Beijing 100094,China [2]Institute of Physics,Chinese Academy of Sciences,Beijing 100190,China
出 处:《Matter and Radiation at Extremes》2024年第4期1-3,共3页极端条件下的物质与辐射(英文)
基 金:supported by the National Key Research and Development Program of China(Grant Nos.2022YFA1403900 and 2021YFA1401800);the NSF of China(Grant Nos.U2032214 and 12104487).
摘 要:The measurement of resistivity in a compressed material within a diamond anvil cell presents significant challenges.The high-pressure exper-imental setup makes it difficult to directly measure the size changes induced by pressure in the three crystallographic directions of the sample.In this study,we introduce a novel and effective method that addresses these technical challenges.This method is anticipated to offer a valuable foundation for high-pressure investigations on quantum materials,particularly those with anisotropic layered structures.
关 键 词:RESISTIVITY METHOD FOUNDATION
分 类 号:TB33[一般工业技术—材料科学与工程]
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