基于加速退化试验的脉宽调制器贮存寿命预测研究  

Pulse width modulator storage life prediction based on accelerated degradation test

作　　者：游文超 孙高宇 彭珂菲 黄姣英[1] YOU Wenchao;SUN Gaoyu;PENG Kefei;HUANG Jiaoying(School of Reliability and Systems Engineering,Beihang University,Beijing 100191,China;School of Automation,Nanjing University of Information Science and Technology,Nanjing 210044,China;School of Engineering,China Agricultural University,Beijing 100083,China)

机构地区：[1]北京航空航天大学可靠性与系统工程学院,北京100191 [2]南京信息工程大学自动化学院,江苏南京210044 [3]中国农业大学工学院,北京100083

出　　处：《现代电子技术》2024年第16期7-12,共6页Modern Electronics Technique

摘　　要：脉宽调制器作为开关电源的核心器件,已广泛应用于航天器中,但其贮存寿命会影响电源系统的可靠性,进而影响航天器任务执行的成败。在寿命评估中,加速退化试验是常用的试验方法,其中激活能值是预测器件贮存寿命的关键,但目前相关标准只有器件激活能值的参考范围,缺乏试验相关条件设置的详细描述,这会影响寿命评估的精度。为此,文中以JW1525脉宽调制器为研究对象,分析JW1525的结构及工作原理,设计并完成72 h的加速退化预试验,得到器件的退化敏感参数作为输出电压。根据预试验结果设计并完成440 h的加速退化正式试验,并结合Arrhenius模型对正式试验结果进行数据处理,得到JW1525的激活能为0.29 eV,常温下贮存寿命将近70年。通过详细的器件结构分析和试验开展,得出脉宽调制器的激活能和常温贮存寿命,可为后续研究提供数据和试验基础。Pulse width modulator,as the core devices of switch-mode power supplies,is widely utilized in spacecraft.However,the storage life of pulse width modulator can impact the reliability of power system,consequently influencing the success or failure of spacecraft mission execution.Accelerated degradation test is a commonly used method in life assessment,where the activation energy value is a crucial factor in predicting the storage life.The relevant standards only have the reference range of device activation energy,and lack the detailed description of test condition setting,which affects the accuracy of life assessment.Therefore,the JW1525 pulse width modulator is taken as the research object,and the structure and working principle of JW1525 are analyzed.A 72 h accelerated degradation pre-test was designed and completed,and the degradation sensitive parameter of the device was obtained as the output voltage.A 440 h accelerated degradation formal testing was designed and completed according to the pre-test results,and the data processing for the formal testing results was conducted by combining with the Arrhenius model.The activation energy of JW1525 was 0.29 eV,and the storage life was nearly 70 years at normal temperature.The activation energy and storage life of pulse width modulator are obtained by the detailed device structure analysis and test,which can provide data and test basis for subsequent research.

关 键 词：加速退化试验 脉宽调制器 贮存寿命 Arrhenius模型 激活能 退化敏感参数 

分 类 号：TN606-34[电子电信—电路与系统]