利用数据管控法提高汽车半导体器件的可靠性  

作　　者：蔺鹏程 王菲 李建超 

机构地区：[1]无锡中微腾芯电子有限公司

出　　处：《质量与标准化》2024年第7期53-57,共5页Quality and Standardization

摘　　要：本文旨在探讨如何利用数据管控法来提高半导体器件的可靠性,尤其是汽车电子系统的可靠性。本文介绍了《基于集成电路应力测试认证的失效机理(H版)》(AEC–Q100),并探讨了如何基于该标准建立模型和算法,实现对半导体器件的在线监测和故障预警,及时发现潜在隐患,剔除可靠性较低的部分器件,以有效地提高半导体器件的可靠性;最后,用案例进行验证。Improving the reliability of semiconductor devices is especially important for automotive electronics.Base on"Failure Mechanism Based Stress Test Qualification for Integrated Circuits-revH"(AEC-Q100),this paper discusses how to establish a model and algorithm based on this standard to realize on-line monitoring and failure warning of semiconductor devices,find potential hidden dangers in time,and eliminate devices with lower reliability,so as to effectively improve the reliability of semiconductor devices;and finally,method validation is carried out.

关 键 词：数据管控 半导体器件 汽车电子 可靠性 标准 

分 类 号：U463.6[机械工程—车辆工程]