A method for determining the complex refractive index dispersion of absorbing materials without thickness information  

作　　者：DENG Zhichao MEI Jianchun WANG Jin YE Qing TIAN Jianguo 

机构地区：[1]Key Laboratory of Weak-Light Nonlinear Photonics,Ministry of Education,School of Physics and TEDA Applied Physics,Nankai University,Tianjin 300071,China

出　　处：《Optoelectronics Letters》2024年第11期676-680,共5页光电子快报（英文版）

基　　金：supported by the National Key R&D Program of China(No.2021YFC2401401)。

摘　　要：The complex refractive index dispersion(CRID)of absorbing materials is very important in many fields,especially in printing industry and medical research.However,due to their strong absorbing,CRID determination is still a challenge.In this study,without diluting treatment or the thickness information,a method is proposed to calculate the CRID of absorbing materials,based merely on the reflectance and transmittance spectra measurements.The method separates the CRID into absorbing part and transparent part based on Kramers-Kronig relations,and it also uses the common Cauchy dispersion formula and Fresnel reflection formula.The CRID of methyl-red-doped poly(methyl methacrylate)(MR-PMMA)(3%mass fraction)and hemoglobin(Hb)solutions(320 g/L)are determined over the spectral range from 400 nm to 750 nm,and the result shows good stability and consistency of the method.

关 键 词：METHOD absorbing DISPERSION 

分 类 号：O433.1[机械工程—光学工程]