Tuning the growth of intermetallic compounds at Sn-0.7Cu solder/Cu substrate interface by adding small amounts of indium  

作　　者：Ancang Yang Yaoping Lu Yonghua Duan Mengnie Li Shanju Zheng Mingjun Peng 

机构地区：[1]Faculty of Material Science and Engineering,Kunming University of Science and Technology,Kunming 650093,China [2]College of Physics and Information Engineering,Fuzhou University,Fuzhou 350108,China

出　　处：《Journal of Materials Science & Technology》2024年第15期246-259,共14页材料科学技术（英文版）

基　　金：supported by the Innovation Team Cultivation Project of Yunnan Province(No.202005AE160016);Key Research&Development Program of Yunnan Province(No.202103AA080017);Yunnan Ten Thousand Talents Plan Young&Elite Talents Project(No.YNWR-QNBJ-2018-044).

摘　　要：The void defect in intermetallic compounds(IMCs)layer at the joints caused by inhomogeneous atomic diffusion is one of the most important factors limiting the further development of Sn-based solders.In this work,the thermodynamic stability of IMCs(high-temperatureη-Cu_(6)Sn_(5)and o-Cu_(3)Sn phases)was improved by adding small amounts of indium(In),and the IMCs layers with moderate thickness,low defect concentrations and stable interface bonding were successfully obtained.The formation order of compounds and the interfacial orientation relationships in IMCs layers,the atomic diffusion mechanism,and the growth tuning mechanism of In onη-Cu_(6)Sn_(5)and Cu_(3)Sn,after In adding,were discussed com-prehensively by combining calculations and experiments.It is the first time that the classic heteroge-neous nucleation theory and CALPHAD data were used to obtain the critical nucleus radius ofη-Cu_(6)Sn_(5)and Cu_(3)Sn,and to explain in detail the main factors affecting the formation order and location of IMCs at joints during the welding process.A novel and systematic growth model about IMCs layers in the case of doping with alloying elements was proposed.The growth tuning mechanism of In doping onη-Cu_(6)Sn_(5)and Cu_(3)Sn was further clarified based on the proposed model using first-principles calculations.The growth model used in this study can provide insights into the development and design of multiele-ment Sn-based solders.

关 键 词：Sn-0.7Cu solder IMCs AGING Atomic migration barrier Growth tuning 

分 类 号：TG146.22[一般工业技术—材料科学与工程]