抗辐照电源监控电路的极限评估试验研究  

Experimental Study on Limit Evaluation of Anti-Irradiation Power Supply Monitoring Circuit

作　　者：文科[1] 文闻 钟昂 余航 罗俊[1] WEN Ke;WEN Wen;ZHONG Ang;YU Hang;LUO Jun(China Electronics Technology Group Corporation No.24 Research Institute,Chongqing 400060,China)

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《电子与封装》2024年第11期33-40,共8页Electronics & Packaging

摘　　要：基于国内某款抗辐照电源监控电路开展了极限评估研究,分析该款产品的详细规范、核心参数、极限判据等内容。通过设计步进应力试验、寿命试验、辐照试验等,评估电路在电、热、机械等应力下的极限能力和失效模式,并对极限评估的方案有效性进行了验证。试验结果表明,设计的极限评估方案能够有效反映器件在各种极限条件下的性能,通过试验可以查出器件的设计薄弱环节和失效模式,为器件在设计、工艺以及材料方面的优化提供支撑。The limit evaluation research is carried out based on a domestic anti-irradiation power supply monitoring circuit.The detailed specifications,core parameters and limit criteria of this product are analyzed.The ultimate capability and failure mode of the circuit under electrical,thermal and mechanical stresses are evaluated by designing the step stress test,life test and irradiation test,and the effectiveness of the limit evaluation scheme is verified.The test results show that the designed limit evaluation scheme can effectively reflect the performance of device under various limit conditions,the design weakness and failure mode of the device can be identified through the test,which provides support for the optimization of the device in design,process and material.

关 键 词：极限评估 电源监控 失效模式 

分 类 号：TN407[电子电信—微电子学与固体电子学]